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Shah, Ajit J. ORCID logoORCID:, de Biasi, Vern and Camilleri, Patrick (1995) Development of a spectrophotometric method for the measurement of thiols at trace levels. Analytical Proceedings including Analytical Communications, 32 (4) . pp. 149-153. ISSN 0144-557X [Article] (doi:10.1039/AI9953200149)

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