Items where Author / Artist / Editor is "Kiefer, Stefan"
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Chen, Taolue and Kiefer, Stefan (2014) On the total variation distance of labelled Markov chains. Proceedings of the Joint Meeting of the Twenty-Third EACSL Annual Conference on Computer Science Logic (CSL) and the Twenty-Ninth Annual ACM/IEEE Symposium on Logic in Computer Science (LICS) - CSL-LICS '14. In: Joint Meeting of the Twenty-Third EACSL Annual Conference on Computer Science Logic (CSL) and the Twenty-Ninth Annual ACM/IEEE Symposium on Logic in Computer Science (LICS) - CSL-LICS 2014, 14-18 Jul 2014, Vienna, Austria. ISBN 9781450328869. [Conference or Workshop Item] (doi:10.1145/2603088.2603099)
