Models of cell assembly decay

Passmore, Peter J. and Huyck, Christian R. (2008) Models of cell assembly decay. In: Cybernetic Intelligent Systems, 2008. CIS 2008. 7th IEEE International Conference. Institute of Electrical and Electronics Engineers, pp. 1-6.

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Official URL: http://dx.doi.org/10.1109/UKRICIS.2008.4798946

Abstract

Hebb considered the cell assembly to represent a concept in the brain and thus to be an underlying construct of human thought. He proposed that the cell assembly is a connected group of neurons whose pattern of firing is such that a reverberatory activity persists after the removal of a stimulus. Once a cell assembly is activated something must eventually cause it to decay. Clearly thoughts have to be extinguished to make way for others, the question is how. Various suggestions have been made concerning mechanisms that could cause an assembly to decay in the long term including inhibition by other assemblies and passive fatigue. In this paper two classes of models are used to implement this decay, the first is based on building cell assemblies with specific weights and connections that have a linear decay. The second class is based on manipulating variables within a cell assembly model, creating long term fatigue or activation decay. This class of models may be more biologically plausible than the first, and can produce the expected temporal dynamics in the presence of an ambiguous stimulus. However neither class can yet produce the correct prolongation of activation when the stimulus is re-presented.

Item Type:Book Section
Research Areas:School of Science and Technology > Computer and Communications Engineering
ID Code:4500
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Deposited On:16 Mar 2010 10:32
Last Modified:13 May 2014 15:37

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