An improved model-based method to test circuit faults

Cheng, Xiaochun ORCID: https://orcid.org/0000-0003-0371-9646, Ouyang, Dantong, Yunfei, Jiang and Zhang, Chengqi (2005) An improved model-based method to test circuit faults. Theoretical Computer Science, 341 (1-3) . pp. 150-161. ISSN 0304-3975 (doi:10.1016/j.tcs.2005.04.004)

Abstract

This paper presents an improved model-based reasoning method to test circuit faults. The proposed automated testing procedure is applicable even when the target system contains multiple faulty modes. Based on the proposed method, the observation can be organised to guarantee correct solutions are included in the restricted candidate space. The existent consistency-checking method and abductive reasoning method are special cases of the proposed method. The relationship between the testing procedure and the corresponding prime implication is formally analyzed for algorithmic implementation. The work is being extended, funded by the Chinese National Natural Science Foundation, in collaboration with Jilin University, China.

Item Type: Article
Research Areas: A. > School of Science and Technology > Computer Science > Artificial Intelligence group
A. > School of Science and Technology > Computer and Communications Engineering
A. > School of Science and Technology
ISI Impact: 1
Item ID: 40
Useful Links:
Depositing User: Repository team
Date Deposited: 14 Oct 2008 12:40
Last Modified: 30 Oct 2019 21:04
URI: https://eprints.mdx.ac.uk/id/eprint/40

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